Subsections
[Cr:4, Lc:4, Tt:0, Lb:0]
- Introduction to Microscopy- Importance of using electrons, concept of resolution, Abbe’s equation, Comparison between light and electron microscope, Interaction of electrons with matter (brief description of secondary electrons, back scattered electrons, Characteristic X-rays, Auger electrons, cathodoluminiscence, transmitted electrons).
- Configuration of Electron Microscopes- Electron Gun, Electron Lenses, Detectors, Vacuum Pumps
- Diffraction- Concept, SAD, CBED, Electron Back Scattered Diffraction (EBSD).
- Fundamentals of Scanning Electron Microscope- Instrumentation, modes of operation, working, Environment Scanning Electron Microscope (ESEM), Low kV SEM, Energy Dispersive X-ray Analysis (EDX), Sample Preparation.
- Fundamentals of Transmission Electron Microscope- Instrumentation, working,Imaging: Basic Principle, Bright field and dark field; High resolution TEM; Scanning
Transmission Electron Microscopy (STEM); Electron Energy Loss Spectroscopy (EELS); Sample Preparation.
- D. B. Williams & C. B. Carter, Transmission Electron Microscopy: A Text book for Material Science.
- W. Zhou & Z. Linwang (editors), Scanning Microscopy for Nanotechnology: Techniques and Applications.
