Subsections
[Cr:4, Lc:3, Tt:0, Lb:0]
This course is useful for anyone interested
in using X-ray diffractometry. It requires some knowledge in symmetry
and algorithms.
- Concepts of symmetry, point groups and space groups; crystal lattices.
- Elements of scattering theory, diffraction principles, reciprocal
lattice; crystals and their properties.
- Basics of the diffractometers; X-ray sources; image plate and CCD
detectors.
- Single crystal methods; data collection and processing strategies;
phase problem in crystallography; Patterson and direct methods.
- Refinement techniques; Molecular structure and crystal structure;
intermolecular interactions and applications in solid state.
- Powder diffraction; Rietveld refinement in powder diffraction.
- Basics of electron density analysis from X-ray diffraction.
- Basics of neutron diffraction, electron diffraction, elements of
electron microscopy.
- C. Giacavazzo, et al. (Editor): Fundamentals of
Crystallography, 2nd Ed, Oxford University Press, USA (2002).
- G. H. Stout, L. H. Jensen, X-Ray Structure Determination: A
Practical Guide, 2nd Ed, Wiley-Interscience, New York (1989).
- J. D. Dunitz, X-Ray Analysis and The Structure of Organic
Molecules, 2nd Ed, Wiley-VCH, New York (1996).
- V. Pecharsky, P. Zavalij, Fundamentals of Powder Diffraction and
Structural Characterization of Materials, 1st Ed, Springer, New York
(2005).
